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Tomographic Imaging Ultra-Thick Specimens with Nanometer Resolution

Published online by Cambridge University Press:  03 August 2008

E Soutry ,
B Freitag ,
D Wall ,
D Tang ,
K Lu  and
J Loos
E Soutry
Affiliation:
FEI, The Netherlands
B Freitag
Affiliation:
FEI, The Netherlands
D Wall
Affiliation:
FEI, The Netherlands
D Tang
Affiliation:
FEI, The Netherlands
K Lu
Affiliation:
Eindhoven University of Technology, The Netherlands
J Loos
Affiliation:
Eindhoven University of Technology, The Netherlands
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1056 - 1057
Copyright
© 2008 Microscopy Society of America

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