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Three-Dimensional Microstructural Characterization of Novel Chalcogenide Nanocomposites for Gradient Refractive Index Applications

Published online by Cambridge University Press:  05 August 2019

Hugues Francois-Saint-Cyr ,
Myungkoo Kang ,
Isabelle Martin ,
Stoichko Antonov ,
Ty J. Prosa  and
Kathleen Richardson
Hugues Francois-Saint-Cyr*
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Myungkoo Kang
Affiliation:
CREOL, the College of Optics and Photonics, University of Central Florida, Orlando, FL 32816USA.
Isabelle Martin
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Stoichko Antonov
Affiliation:
University Science and Technology Beijing, 30 Xueyuan Rd, Haidian District, Beijing, 100083China.
Ty J. Prosa
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
Kathleen Richardson
Affiliation:
CREOL, the College of Optics and Photonics, University of Central Florida, Orlando, FL 32816USA.
*
*Corresponding author: hugues.fsc@ametek.com

Abstract

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Type
New Frontiers in Atom Probe Tomography Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2500 - 2501
Copyright
Copyright © Microscopy Society of America 2019 

Footnotes

†

These authors contributed to this work equally.

References

[1]Teichman, J. et al. , Gradient Index Optics at DARPA, The Institute for Defense Analyses (2014).Google Scholar
[2]Sisken, L., PhD Dissertation, University of Central Florida (2017).Google Scholar
[3]Kang, M. et al. , Adv. Mater. 30 (2018), 1803628.Google Scholar
[4]Larson, D. J. et al. , “Local Electrode Atom Probe Tomography”, Springer, New York (2013).Google Scholar
[5]The authors acknowledge the partial support of UCF's Pre-eminent Post-doctoral Scholar Program.Google Scholar