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Thickness and Stacking Sequence Determination of Exfoliated Dichalchogenides Using Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

Pengzi Liu ,
Robert Hovden ,
Adam W. Tsen ,
Philip Kim ,
Abhay N. Pasupathy  and
Lena F. Kourkoutis
Pengzi Liu
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York, USA
Robert Hovden
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York, USA
Adam W. Tsen
Affiliation:
Department of Physics, Columbia University, New York, New York, USA
Philip Kim
Affiliation:
Department of Physics, Columbia University, New York, New York, USA Department of Physics, Harvard University, Cambridge, Massachusetts, USA
Abhay N. Pasupathy
Affiliation:
Department of Physics, Columbia University, New York, New York, USA
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York, USA Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1456 - 1457
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Tsen, A. W., Hovden, R., et al., Proc. Natl. Acad. Sci. U.S.A 112 (2015) 15054–15059.CrossRefGoogle Scholar
[2] We thank Yu Liu, Wenjian J. Lu, and Yuping Sun for providing the TaS2 crystal. This work was supported by the Packard Foundation and made use of the Cornell Center for Materials Research Facilities which are supported through the NSF MRSEC program (DMR-1120296).Google Scholar