Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-17T14:42:38.337Z Has data issue: false hasContentIssue false

Thermal Fatigue and Failure Analysis of Cu-Plated Through Hole Solder Joints

Published online by Cambridge University Press:  26 July 2009

DF Susan
Affiliation:
Sandia National Laboratories
AC Kilgo
Affiliation:
Sandia National Laboratories
PT Vianco
Affiliation:
Sandia National Laboratories
MK Neilsen
Affiliation:
Sandia National Laboratories

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009