Hostname: page-component-77c89778f8-n9wrp Total loading time: 0 Render date: 2024-07-18T05:10:34.738Z Has data issue: false hasContentIssue false
  • English
  • Français

Temporal Compressive Sensing Instrumentation for TEM

Published online by Cambridge University Press:  04 August 2017

Daniel J. Masiel ,
Ruth S. Bloom ,
Sang Tae Park  and
Bryan W. Reed
Daniel J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America
Ruth S. Bloom
Affiliation:
Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America
Sang Tae Park
Affiliation:
Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America
Bryan W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 20 - 21
Copyright
© Microscopy Society of America 2017 

References

[1] Reed, B W, et al Microsc. Microanal. (2016) submitted.Google Scholar
[2] Stevens, A., et al Adv. Struct. Chem. Imaging (2015) pi.Google Scholar