Hostname: page-component-8448b6f56d-mp689 Total loading time: 0 Render date: 2024-04-23T19:59:12.795Z Has data issue: false hasContentIssue false
  • English
  • Français

Temperature Mapping with STEM Atomic Scale Debye-Waller Thermometry

Published online by Cambridge University Press:  22 July 2022

Menglin Zhu  and
Jinwoo Hwang
Menglin Zhu
Affiliation:
Department of Materials Science and Engineering, Ohio State University, Columbus, OH, 43210
Jinwoo Hwang*
Affiliation:
Department of Materials Science and Engineering, Ohio State University, Columbus, OH, 43210
*
*Corresponding author: hwang.458@osu.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Beyond Visualization with In Situ and Operando TEM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 118 - 120
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Cahill, D. G. et al. J. Appl. Phys. 93, 793–818 (2003)CrossRefGoogle Scholar
Bonneaux, J. et al. Intermetallics 7, 797–805 (1999)CrossRefGoogle Scholar
Mecklenburg, M. et al. Science (80-.) 347, 629–632 (2015)CrossRefGoogle Scholar
Niekiel, F. et al. Ultramicroscopy 176, 161–169 (2017)CrossRefGoogle Scholar
Zhu, M. et al. Ultramicroscopy 232, 113419 (2022)CrossRefGoogle Scholar
This work is supported by NSF CAREER Program, DMR-1847964.Google Scholar