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The Temperature Dependence of Defect Evolution in Irradiated Graphite

Published online by Cambridge University Press:  05 August 2019

Steve Johns
Affiliation:
Micron School of Materials Science and Engineering, Boise State University, Boise, ID, USA.
Joshua J. Kane
Affiliation:
Idaho National Laboratory, Idaho Falls, ID, USA.
William E. Windes
Affiliation:
Idaho National Laboratory, Idaho Falls, ID, USA.
Rick Ubic
Affiliation:
Micron School of Materials Science and Engineering, Boise State University, Boise, ID, USA.
K. Bustillo
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, USA.
Chinnathambi Karthik*
Affiliation:
Micron School of Materials Science and Engineering, Boise State University, Boise, ID, USA.
*
*Corresponding author: karthikchinnathambi@boisestate.edu

Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Marsden, BJ et al. , International Materials Reviews 61 (2016), p. 155.Google Scholar
[2]Johns, S et al. , Carbon 143 (2019), p. 908.Google Scholar
[3]The authors acknowledge funding from U. S. Department of Energy's EPSCoR-State/National Laboratory Partnership Program (Award # DE-SC0016427), and that work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. This document was prepared by Steve Johns as a result of the use of facilities of the U.S. Department of Energy (DOE), which are managed by The Regents of the University of California, acting under Contract No.DE-AC02-05CH11231. Neither The Regents of the University of California DOE, the U.S. Government, nor any person acting on their behalf: (a) make any warranty or representation, express or implied, with respect to the information contained in this document; or (b) assume any liabilities with respect to the use of, or damages resulting from the use of any information contained in the document.Google Scholar