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TEM Observation on Single Defect in SiC

Published online by Cambridge University Press:  01 August 2002

J. Q. Liu ,
M. Skowronski ,
P. G. Neudeck  and
J. A. Powell
J. Q. Liu
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 USA
M. Skowronski
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 USA
P. G. Neudeck
Affiliation:
NASA Glenn Research Center, 21000 Brookpark Road, M.S. 77-1, Cleveland, OH 44135 USA
J. A. Powell
Affiliation:
NASA Glenn Research Center, 21000 Brookpark Road, M.S. 77-1, Cleveland, OH 44135 USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1180 - 1181
Copyright
Copyright © Microscopy Society of America 2002