Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-25T12:06:56.050Z Has data issue: false hasContentIssue false
  • English
  • Français

Status of the PolLux STXM Beamline.

Published online by Cambridge University Press:  10 August 2018

Benjamin Watts ,
Simone Finizio ,
Katharina Witte ,
Manuel Langer ,
Sina Mayr ,
Sebastian Wintz ,
Blagoj Sarafimov  and
Jorg Raabe
Benjamin Watts*
Affiliation:
Swiss Light Source, Paul Scherrer Institute, 5232Villigen-PSI, Switzerland.
Simone Finizio
Affiliation:
Swiss Light Source, Paul Scherrer Institute, 5232Villigen-PSI, Switzerland.
Katharina Witte
Affiliation:
Swiss Light Source, Paul Scherrer Institute, 5232Villigen-PSI, Switzerland.
Manuel Langer
Affiliation:
Swiss Light Source, Paul Scherrer Institute, 5232Villigen-PSI, Switzerland.
Sina Mayr
Affiliation:
Swiss Light Source, Paul Scherrer Institute, 5232Villigen-PSI, Switzerland.
Sebastian Wintz
Affiliation:
Swiss Light Source, Paul Scherrer Institute, 5232Villigen-PSI, Switzerland.
Blagoj Sarafimov
Affiliation:
Swiss Light Source, Paul Scherrer Institute, 5232Villigen-PSI, Switzerland.
Jorg Raabe
Affiliation:
Swiss Light Source, Paul Scherrer Institute, 5232Villigen-PSI, Switzerland.
*
*Corresponding author, benjamin.watts@psi.ch

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 476 - 477
Copyright
© Microscopy Society of America 2018 

References

[1] Raabe, J, et al, Rev. Sci. Instrum. 79 2008 113704.CrossRefGoogle Scholar
[2] Flechsig, U, et al, AIP Conf. Proc. 879 2006) p. 505.Google Scholar
[3] Frommherz, U, et al, AIP Conf. Proc. 1234 2010) p. 429.Google Scholar
[4] Witte, K, et al, J. Phys. Chem. B 122 2018) p. 1846.Google Scholar
[5] Xie, C, et al, Adv. Energy Mater. 8 2018 1702857.Google Scholar
[6] Du, X, et al, Macromol 50 2017) p. 2415.CrossRefGoogle Scholar
[7] Farinhas, J, et al, Org. Electron. 41 2017) p. 130.Google Scholar
[8] Janneck, R, et al, Adv. Mater. 29 2017 1703864.Google Scholar
[9] Woo, S, et al, Nat. Commun. 9 2018) p. 959.CrossRefGoogle Scholar
[10] Maccariello, D, et al, Nature Nanotechnol 13 2018) p. 233.Google Scholar
[11] Finizio, S, et al, Phys. Rev. B 96 2017 054438.Google Scholar
[12] Fritz, F, et al, Nanotechnology 28 2017 435703.Google Scholar
[13] Baumgartner, M, et al, Nat. Nanotechnol. 12 2017) p. 980.Google Scholar
[14] Alpert, PA, et al, Sci. Rep. 7 2017 12693.CrossRefGoogle Scholar
[15] Pignatelli, I, et al, Geochim. Cosmochim. Ac 209 2017) p. 106.Google Scholar
[16] Miot, J, et al, Chem. Geo 434 2016) p. 28.CrossRefGoogle Scholar
[17] Bonneville, S, et al, Environ. Sci. Technol. 50 2016) p. 5589.Google Scholar
[18] Watts, B, et al, J. Instrum. 13 2018 C04001.Google Scholar
[19] https://www.psi.ch/microspec/pixelator.Google Scholar
[20] Finizio, S, et al, XRM2018 2018 015243.Google Scholar
[21] Finizio, S, et al, XRM2018 2018 013869.Google Scholar
[22] Watts, B, et al, AIP Conf. Proc. 1696 2016 020042..CrossRefGoogle Scholar
[23] ISO 16684–166841, 2012.Google Scholar
[24] Rosner, B, et al, Microelectronic Engineering 191 2018) p. 91.Google Scholar
[25] Rosner, B, et al, XRM2018 2018 015376.Google Scholar
[26] The PolLux end station was financed by the German Minister fur Bildung und Forschung (BMBF) through contracts 05KS4WE1/6 and 05KS7WE1..Google Scholar