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State-of-the-Art Three-Dimensional Chemical Characterization of Solid Oxide Fuel Cell Using Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Tomography

Published online by Cambridge University Press:  21 December 2016

Agnieszka Priebe Open the ORCID record for Agnieszka Priebe [Opens in a new window] ,
Pierre Bleuet ,
Gael Goret ,
Jerome Laurencin ,
Dario Montinaro  and
Jean-Paul Barnes
Agnieszka Priebe*
Affiliation:
Université Grenoble Alpes, F-38000 GrenobleFrance CEA (French Alternative Energies and Atomic Energy Commission), LETI (Research Institute For Electronics And Information Technologies), DTSI (Department of Silicon Technologies), MINATEC Campus, F-38054 Grenoble, France
Pierre Bleuet
Affiliation:
Université Grenoble Alpes, F-38000 GrenobleFrance CEA (French Alternative Energies and Atomic Energy Commission), LETI (Research Institute For Electronics And Information Technologies), DTSI (Department of Silicon Technologies), MINATEC Campus, F-38054 Grenoble, France
Gael Goret
Affiliation:
Université Grenoble Alpes, F-38000 GrenobleFrance CEA (French Alternative Energies and Atomic Energy Commission), LETI (Research Institute For Electronics And Information Technologies), DTSI (Department of Silicon Technologies), MINATEC Campus, F-38054 Grenoble, France
Jerome Laurencin
Affiliation:
Université Grenoble Alpes, F-38000 GrenobleFrance CEA, LITEN, MINATEC Campus, F-38054 Grenoble, France
Dario Montinaro
Affiliation:
SOLIDpower S.p.a., 38017 Mezzolombardo, Italy
Jean-Paul Barnes
Affiliation:
Université Grenoble Alpes, F-38000 GrenobleFrance CEA (French Alternative Energies and Atomic Energy Commission), LETI (Research Institute For Electronics And Information Technologies), DTSI (Department of Silicon Technologies), MINATEC Campus, F-38054 Grenoble, France
*
*Corresponding author. agnieszka.priebe@gmail.com
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Abstract

In this paper the potential of time-of-flight secondary ion mass spectroscopy combined with focused ion beam technology to characterize the composition of a solid oxide fuel cell (SOFC) in three-dimension is demonstrated. The very high sensitivity of this method allows even very small amounts of elements/compounds to be detected and localized. Therefore, interlayer diffusion of elements between porous electrodes and presence of pollutants can be analyzed with a spatial resolution of the order of 100 nm. However, proper element recognition and mass interference still remain important issues. Here, we present a complete elemental analysis of the SOFC as well as techniques that help to validate the reliability of obtained results. A discussion on origins of probable artifacts is provided.

Keywords

TOF-SIMSFIB3D tomographychemical structureSOFC
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 22 , Issue 6 , December 2016 , pp. 1261 - 1269
Copyright
© Microscopy Society of America 2016 

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