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Standardless EDS Composition Analysis using Quantitative Annular Dark-Field Imaging

Published online by Cambridge University Press:  04 August 2017

J. Houston Dycus
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA
Weizong Xu
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Lichtenwalner, D. J., et al, Applied Physics Letters 105(18 2014.Google Scholar
[1] Cliff, G. & Lorimer, G.W. Journal of Microscopy 103(2 1975). p. 203207.Google Scholar
[2] Watanabe, M. & Williams, D. B. Journal of Microscopy 221(2 2006). p. 89109.Google Scholar
[3] Chen, Z., et al, Ultramicroscopy 168 2016). p. 716.Google Scholar
[4] LeBeau, J. M., et al, Physical Review Letters 100(20 2008). p. 206101.Google Scholar
[5] Rosenauer, A., et al., Ultramicroscopy 109(9 2009). p. 11711182.Google Scholar
[9] JHD, WX and JML acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University. JHD acknowledges support by the National Science Foundation Graduate Research Fellowship (Grant DGE-1252376).Google Scholar