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SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography

Published online by Cambridge University Press:  05 August 2019

Chen-Ting Liao*
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
Yuan Hung Lo
Affiliation:
Department of Bioengineering, University of California Los Angeles, CA 90095, USA. Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, CA 90095, USA.
Jihan Zhou
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, CA 90095, USA.
Arjun Rana
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, CA 90095, USA.
Charles S. Bevis
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
Guan Gui
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
Bjoern Enders
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Kevin Cannon
Affiliation:
Department of Physics, University of Central Florida, Orlando, FL 32816, USA.
David Shapiro
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Chris Bennett
Affiliation:
Department of Physics, University of Central Florida, Orlando, FL 32816, USA.
Henry Kapteyn
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
Roger Falcone
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
Jianwei Miao
Affiliation:
Department of Physics and Astronomy and California NanoSystems Institute, University of California Los Angeles, CA 90095, USA.
Margaret Murnane
Affiliation:
JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA.
*
*Corresponding author: ChenTing.Liao@Colorado.edu
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Abstract

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Type
Advances in Phase Retrieval Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Miao, J., Ishikawa, T., Robinson, I. K. and Murnane, M. M. Science 348, 530535 (2015).CrossRefGoogle Scholar
[2]Pfeiffer, F. Nat. Photonics 12, 917 (2018).CrossRefGoogle Scholar
[3]Celestre, R., et al. J. Phys. Conf. Ser. 849, 04 (2017).CrossRefGoogle Scholar
[4]Gardner, D., et al. Nat. Photonics 11.4, 259 (2017).CrossRefGoogle Scholar
[5]Jones, M., et al. Sci. Rep. 4, (2014).Google Scholar
[6]Yan, H., et al. Sci. Rep. 6, 20112 (2016).CrossRefGoogle Scholar
[7]Henke, B., Gullikson, E., and Davis, J.. Atomic Data and Nuclear Data Tables. 54, 181 (1993).CrossRefGoogle Scholar
[8]This work was supported by STROBE: A National Science Foundation Science & Technology Center, under Grant No. DMR 1548924.Google Scholar
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SQUARREL: Scattering Quotient Analysis to Retrieve the Ratio of Elements in X-ray Ptychography
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