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SIS-HOLZ Strain Measurements Through the Thickness of a SI Crystal

Published online by Cambridge University Press:  01 August 2018

Mana Norouzpour  and
Rodney Herring
Mana Norouzpour
Affiliation:
University of Victoria, Canada
Rodney Herring
Affiliation:
University of Victoria, Canada

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 40 - 41
Copyright
© Microscopy Society of America 2018 

References

[1] Herring, R. A., et al, Microsc. Microanal 2011) p. 1232.Google Scholar
[2] Herring, R.A., et al, Ultramicroscopy 156 2015) p. 37.Google Scholar
[3] Norouzpour, M. Herring, R.A. Microsc. Microanal 21(S3 2015) p. 1965.Google Scholar
[4] Norouzpour, M. Herring, R.A. Microsc. Microanal 23(S1 2017) p. 1418.Google Scholar
[5] Norouzpour, M. Herring, R.A. JMR 32(5 2017) p. 996.Google Scholar
[6] Norouzpour, M., Rakhsha, R. Herring, R. Micron 97 2017) p. 68.Google Scholar
[7] Saitoh, Koh, et al, J. Electron Microscopy 59(5 2010) p. 367.Google Scholar