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Simulation and Analysis of Methods for Scanning Tunneling Microscopy Feedback Control

Published online by Cambridge University Press:  14 March 2019

Jeremy Wiedemeier ,
Greg Spencer ,
Mark J. Hagmann  and
Marwan S. Mousa
Jeremy Wiedemeier
Affiliation:
NewPath Research L.L.C., 2880 S. Main Street, Suite 214, Salt Lake City, UT, 84115, USA
Greg Spencer
Affiliation:
NewPath Research L.L.C., 2880 S. Main Street, Suite 214, Salt Lake City, UT, 84115, USA
Mark J. Hagmann*
Affiliation:
NewPath Research L.L.C., 2880 S. Main Street, Suite 214, Salt Lake City, UT, 84115, USA
Marwan S. Mousa
Affiliation:
NewPath Research L.L.C., 2880 S. Main Street, Suite 214, Salt Lake City, UT, 84115, USA
*
*Author for correspondence: Mark J. Hagmann, E-mail: newpathresearch@gmail.com
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Abstract

A scanning tunneling microscope (STM) requires precise control of the tip–sample distance to maintain a constant set-point tunneling current. Typically, the tip–sample distance is controlled through the use of a control algorithm. The control algorithm takes in the measured tunneling current and returns a correction to the tip–sample distance in order to achieve and maintain the set-point value for tunneling current. We have developed an STM simulator to test the accuracy and performance of four control algorithms. The operation and effectiveness of these control algorithms are evaluated.

Keywords

Controlfeedbackmicroscopescanningtunneling
Type
Related Techniques
Information
Microscopy and Microanalysis , Volume 25 , Special Issue 2: Atom Probe Tomography and Microscopy APT&M 2018 , April 2019 , pp. 554 - 560
Copyright
Copyright © Microscopy Society of America 2019 

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