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SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions

Published online by Cambridge University Press:  23 September 2015

Raphaelle Dianoux ,
Adi Scheidemann ,
Ewald Niehuis ,
Rudolf Mollers ,
Felix Kollmer ,
Henrik Arlinghaus ,
Hans-Josef Hug ,
Laetitia Bernard  and
Sasa Vranjkovic
Raphaelle Dianoux
Affiliation:
NanoScan AG, Duebendorf, Switerzland
Adi Scheidemann
Affiliation:
NanoScan AG, Duebendorf, Switerzland
Ewald Niehuis
Affiliation:
ION-TOF GmbH, Muenster, Germany
Rudolf Mollers
Affiliation:
ION-TOF GmbH, Muenster, Germany
Felix Kollmer
Affiliation:
ION-TOF GmbH, Muenster, Germany
Henrik Arlinghaus
Affiliation:
ION-TOF GmbH, Muenster, Germany
Hans-Josef Hug
Affiliation:
Empa, Duebendorf, Switzerland
Laetitia Bernard
Affiliation:
Empa, Duebendorf, Switzerland
Sasa Vranjkovic
Affiliation:
Empa, Duebendorf, Switzerland

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1431 - 1432
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Stipe, B.C., et al, Nature Photonics 4 (2010), p 484.Google Scholar
[2] Sugimoto, Y., et al, Nature 446 (2007), p 64.Google Scholar
[3] Iktgen, K., et al, . in" Secondary Ion Mass Spectrometry", SIMS X., ed. A. Bennighoven, B. Hagenhoff and H.W. Werner, (John Wiley & Son).Google Scholar
[4] The authors acknowledge funding from the European Commission (FP7, Grant number 200613).Google Scholar
[5] Kollmer, F., et al, Surf. Interface Anal 45 (2013), p 312.Google Scholar