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SEM Applied on Magnetic Materials: Magnetic Contrast and Morphology Imaging

Published online by Cambridge University Press:  05 August 2019

U Golla-Schindler ,
R Loeffler ,
T Groß ,
J Laukart ,
D Goll  and
G Schneider
U Golla-Schindler*
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
R Loeffler
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
T Groß
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
J Laukart
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
D Goll
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
G Schneider
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
*
*Corresponding author: ute.golla-schindler@hs-aalen.de

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2326 - 2327
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Reimer, L, Scanning Electron Microscopy ed. Hawkes, P.W., (Springer, Berlin), p.257.Google Scholar
[2]Goll, D, Kronmueller, H and Stadelmaier, HH, J. Appl. Phys. 96 (2004), p. 6534.Google Scholar
[3]The authors gratefully acknowledge the German BMBF for financial support.Google Scholar