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Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-ray Microanalysis

Published online by Cambridge University Press:  01 August 2018

Yu Yuan ,
Hendrix Demers  and
Raynald Gauvin
Yu Yuan
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Centre d’excellence en electrification des transports et stockage d’energie, IREQ, Varennes, Quebec, Canada
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 778 - 779
Copyright
© Microscopy Society of America 2018 

References

[1] Gauvin, R Michaud, P Microscopy and Microanalysis 15 2009) p. 488–489.Google Scholar
[2] Goldstein, J in Scanning electron microscopy and x-ray microscopy (ed. D Writers Plenum Press New York p. 322.Google Scholar
[3] Yuan, Y, Demers, H Gauvin, R Microscopy and Microanalysis 23 2017) p. 218–219.Google Scholar