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Scanning Ion Conductance Microscopy (SICM) for Low-stress Directly Examining of Cellular Mechanics

Published online by Cambridge University Press:  30 July 2020

Petr Gorelkin
Affiliation:
Medical Nanotechnologyn; National University of Science and Technology MISiS, Moscow, Moskva, Russia
Alexander Erofeev
Affiliation:
National University of Science and Technology “MISIS”; Lomonosov Moscow State University, Moscow, Moskva, Russia
Vasilii Kolmogorov
Affiliation:
National University of Science and Technology “MISIS”; Lomonosov Moscow State University, Moscow, Moskva, Russia
Yuri Efremov
Affiliation:
I.M. Sechenov First Moscow State Medical University (Sechenov University), Moscow, Moskva, Russia
Pavel Novak
Affiliation:
National University of Science and Technology “MISIS”; Lomonosov Moscow State University, Moscow, Moskva, Russia
Andrew Shevchuk
Affiliation:
Imperial College London, London, England, United Kingdom
Alexander Majouga
Affiliation:
National University of Science and Technology “MISIS”; Lomonosov Moscow State University, Moscow, Moskva, Russia
Yuri Korchev
Affiliation:
Imperial College London, London, England, United Kingdom
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Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy III - Applications to Interface Chemistry
Copyright
Copyright © Microscopy Society of America 2020

References

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Zhang, Y., Takahashi, Y., Hong, S. P., Liu, F., Bednarska, J., Goff, P. S., Novak, P., Shevchuk, A., Gopal, S., Barozzi, I., Magnani, L., Sakai, H., Suguru, Y., Fujii, T., Erofeev, A., Gorelkin, P., Majouga, A., Weiss, D. J., Edwards, C., Ivanov, A. P., Klenerman, D., Sviderskaya, E. V., Edel, J. B. & Korchev, Y. (2019). Nature Communications 10, 5610.Google Scholar
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Scanning Ion Conductance Microscopy (SICM) for Low-stress Directly Examining of Cellular Mechanics
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