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Scanning Electron Microscopes with Integrated Raman Spectrometer Revealing New Complementary Information

Published online by Cambridge University Press:  25 July 2016

Stefanie Freitag
Stefanie Freitag*
Affiliation:
Carl Zeiss Microscopy GmbH, Market Segment Material Sciences, Munich Site, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 22 - 23
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Smith, E., et al, “Modern Raman Spectroscopy A practical approach”. Wiley (2013).Google Scholar
[2] Gardiner, D.J., et al, “Practical Raman spectroscopy”. Springer (1989).CrossRefGoogle Scholar