No CrossRef data available.
Article contents
Scanning confocal electron diffraction (SCED): high angular resolution diffraction imaging with order-of-magnitude improved dose efficiency
Published online by Cambridge University Press: 30 July 2021
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927621001306/resource/name/firstPage-S1431927621001306a.jpg)
- Type
- Diffraction Imaging Across Disciplines
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Ophus, C. (2019). Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond. Microscopy and Microanalysis, (2019), 563–582.CrossRefGoogle ScholarPubMed
Panova, O., Ophus, C., Takacs, , et al. , (2019). Diffraction imaging of nanocrystalline structures in organic semiconductor molecular thin films. Nature Materials, 18(August) 860Google ScholarPubMed
Frigo, S. P., Levine, Z. H., & Zaluzec, N. J. (2002). Submicron imaging of buried integrated circuit structures using scanning confocal electron microscopy. Applied Physics Letters, 81(11), 2112.CrossRefGoogle Scholar
Wang, P., Behan, G., Kirkland, A. I., et al. , (2011). Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope. Ultramicroscopy, 111(7), 877–886.CrossRefGoogle ScholarPubMed
Berlinghof, M., Langner, S., Harreiß, C. et al. , (2020). Crystal-structure of active layers of small molecule organic photovoltaics before and after solvent vapor annealing. Zeitschrift Für Kristallographie - Crystalline Materials, 235(1–2), 15–28.CrossRefGoogle Scholar