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A Round Robin Experiment: Analysis of Solute Clustering from Atom Probe Tomography Data.

Published online by Cambridge University Press:  25 July 2016

Emmanuelle A. Marquis
Affiliation:
1Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, U.S.A.
Vicente Araullo-Peters
Affiliation:
1Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, U.S.A.
Aurianne Etienne
Affiliation:
Groupe de Physique des Materiaux, UMR CNRS 6634, Universite de Rouen, Saint Etienne du Rouvray Cedex, France
Svetlana Fedotova
Affiliation:
Institute of Nuclear Safety System, Inc., Kyoto, Japan
Katsuhiko Fujii
Affiliation:
NRC “Kurchatov Institute”, Moscow, Russia
Koji Fukuya
Affiliation:
NRC “Kurchatov Institute”, Moscow, Russia
Evgenia Kuleshova
Affiliation:
Institute of Nuclear Safety System, Inc., Kyoto, Japan
Anabelle Legrand
Affiliation:
Commissariat a l’Energie Atomique (CEA), Saclay, France
Andrew London
Affiliation:
Department of Materials, University of Oxford, U.K.
Sergio Lozano-Perez
Affiliation:
Department of Materials, University of Oxford, U.K.
Yasuyoshi Nagai
Affiliation:
Institute for Materials Research, Tohoku University, OaraiJapan
Kenji Nishida
Affiliation:
Materials Science Research Laboratory, Central Research Institute of Electric Power Industry, Nagasaka, Japan
Bertrand Radiguet
Affiliation:
Groupe de Physique des Materiaux, UMR CNRS 6634, Universite de Rouen, Saint Etienne du Rouvray Cedex, France
Daniel Schreiber
Affiliation:
Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA, U.S.A.
Naoki Soneda
Affiliation:
Materials Science Research Laboratory, Central Research Institute of Electric Power Industry, Nagasaka, Japan
Mattias Thuvander
Affiliation:
Department of Physics, Chalmers University of Technology, Chalmers, Sweden
Takeshi Toyama
Affiliation:
Department of Materials, University of Oxford, U.K.
Faiza Sefta
Affiliation:
Departement Métallurgie, EDF, Moret sur Loing, France
Peter Chou
Affiliation:
Electric Power Research Institute, Palo Alto, CA, U.S.A.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Vaumousse, D, Cerezo, A & Warren., PJ Ultramicroscopy 95 (2003). p 215.Google Scholar
[2] Stephenson, LT, Moody, MP, Liddicoat, PV & Ringer., SP Microscopy and Microanalysis 13 (2007). p 448.CrossRefGoogle Scholar
[3] Philippe, T, De Geuser, F, Duguay, S, Lefebvre, W, Cojocaru-Miredin, O, Da Costa, G & Blavette., D Ultramicroscopy 109 (2009). p 1304.Google Scholar
[4] The authors acknowledge partial financial support from EPRI and EDF-MAI.Google Scholar