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The Role of Secondary Electron Emission in the Charging of Thin-Film Phase Plates

Published online by Cambridge University Press:  25 July 2016

M. Dries ,
R. Janzen ,
T. Schulze ,
J. Schundelmeier ,
S. Hettler ,
U. Golla-Schindler ,
B. Jaud ,
U. Kaiser  and
D. Gerthsen
M. Dries
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
R. Janzen
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
T. Schulze
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
J. Schundelmeier
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
S. Hettler
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Karlsruhe, Germany
U. Golla-Schindler
Affiliation:
Electron Microscopy Group of Material Science, University of Ulm, Ulm, Germany
B. Jaud
Affiliation:
Electron Microscopy Group of Material Science, University of Ulm, Ulm, Germany
U. Kaiser
Affiliation:
Electron Microscopy Group of Material Science, University of Ulm, Ulm, Germany
D. Gerthsen
Affiliation:
Electron Microscopy Group of Material Science, University of Ulm, Ulm, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 64 - 65
Copyright
© Microscopy Society of America 2016 

References

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[7] Financial support by the Deutsche Forschungsgemeinschaft (DFG).Google Scholar