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Rapid Mechanical Property Tomograms Generated by Indentation Testing

Published online by Cambridge University Press:  01 August 2018

K. E. Johanns ,
B. Crawford  and
K. H. Parks
K. E. Johanns
Affiliation:
Nanomechanics, Inc., Oak Ridge, USA.
B. Crawford
Affiliation:
Nanomechanics, Inc., Oak Ridge, USA.
K. H. Parks
Affiliation:
Nanomechanics, Inc., Oak Ridge, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2192 - 2193
Copyright
© Microscopy Society of America 2018 

References

[1] Oliver, W. C. Pharr, G. M. JMR 1992.Google Scholar
[2] The authors would like to thank T. Shaw and H. Huang of the TJ Watson Research Center of IBM and the Albany Nanotechnology Research Center of IBM, respectively, for the multilayer thin film sample..Google Scholar