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Radiation damage study of organic molecules via laser-free ultrafast transmission electron microscopy

Published online by Cambridge University Press:  30 July 2021

Hyeokmin Choe*
Affiliation:
National Institute of Standards and Technology, United States
Eric Montgomery
Affiliation:
Euclid Techlabs, United States
Ilya Ponomarev
Affiliation:
Euclid Techlabs LLC, United States
June Lau
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland, United States
Yimei Zhu
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA, United States
Yubin Zhao
Affiliation:
Euclid Techlabs LLC, United States
Ao Liu
Affiliation:
Euclid Techlabs LLC, United States
Alexei Kanareykin
Affiliation:
Euclid Techlabs LLC, United States
Chunguang Jing
Affiliation:
Euclid Techlabs LLC, United States
*
*Corresponding author: hyeokmin.choe@nist.gov

Abstract

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Type
Exploring Beam-sample Interactions for Uncovering the Atomic or Dynamic Nature of Matter
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

VandenBussche, et al. , Nano Letters. 19, (2019) 6687. DOI: 10.1021/acs.nanolett.9b03074CrossRefGoogle Scholar
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Jing, C, et al. , Ultramicroscopy, 207 (2019) 112829. DOI: 10.1016/j.ultramic.2019.112829Google Scholar
2020 Microscopy Innovation Award (Microscopy Today)Google Scholar
2019 R&D100 Award for “Affordable Laser-free Retrofittable Stroboscopic Solution for Ultra-fast Electron Microscopy” (R&D 100 Magazine)Google Scholar