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A Quantitative Method for In-Situ Pump-Beam Metrology in Ultrafast Electron Microscopy

Published online by Cambridge University Press:  30 July 2021

Jialiang Chen ,
Chris Leighton  and
David Flannigan
Jialiang Chen
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota, United States
Chris Leighton
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota, United States
David Flannigan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, Minnesota, United States

Abstract

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Type
Fast and Ultrafast Dynamics Using Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3416 - 3418
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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This work was supported partially by the American Chemical Society Petroleum Research Fund and partially by the U.S. Department of Energy through the UMN Center for Quantum Materials under Grant No. DE-SC-0016371.Google Scholar