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Quantitative Electron Microscopy and the Application by Single Electron Signals

Published online by Cambridge University Press:  23 September 2015

Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo, Japan
Andrew. R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Scott D. Findlay
Affiliation:
School of Physics, Monash University, Victoria 3800, Australia
Takashi Taniguchi
Affiliation:
Advanced Key Technologies Division, National Institute for Materials Science, Tsukuba, Japan
Stephen J. Pennycook
Affiliation:
Advanced Key Technologies Division, National Institute for Materials Science, Tsukuba, Japan
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Abstract

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Copyright © Microscopy Society of America 2015 

References

[1] LeBeau, J.M., et al, Phys. Rev. Lett 100 (2008) 206101.CrossRefGoogle Scholar
[2] Ishikawa, R., et al, Microsc. Microanal 20 (2014) 99.CrossRefGoogle Scholar
[3] Ishikawa, R., et al, Nano Lett 14 (2014) 1903.CrossRefGoogle Scholar
[4] R.I. acknowledges support from JSPS Postdoctoral Fellowship for Research Abroad and Prof. Naoyoa Shibata and Prof. Yuichi Ikuhara (University of Tokyo) for helpful discussions. A.R.L. acknowledges support by the U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division. S.D.F. acknowledges support under the Discovery Projects funding scheme of the Australian Research Council. R.I. and T.T. acknowledge support by a Grant-in-Aid for Scientific Research on Innovative Areas “Nano Informatics” (Grant 25106006) from JSPS.Google Scholar
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