Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-19T20:48:59.632Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Determination of van Gogh's Painting Grounds Using SEM/EDX

Published online by Cambridge University Press:  13 December 2010

Ralph Haswell ,
Leslie Carlyle  and
Kees T.J. Mensch
Ralph Haswell*
Affiliation:
Shell Global Solutions International B.V., STCA, Amsterdam, 1030BN, The Netherlands
Leslie Carlyle
Affiliation:
New University of Lisbon, Conservation and Restoration Campus Caparica, Caparica, 2829-516, Portugal
Kees T.J. Mensch
Affiliation:
Shell Global Solutions International B.V., STCA, Amsterdam, 1030BN, The Netherlands
*
Corresponding author. E-mail: ralph.haswell@shell.com
Get access

Abstract

We have investigated the potential of utilizing analytical electron microscopy to quantitatively examine the grounds used by van Gogh and, in particular, the absolute amount of extender employed. To determine the accuracy that can be achieved, a series of oil paint reconstructions were used as standards. The proportion of extender was measured using scanning electron microscopy and energy dispersive X-ray spectroscopy, and a relative error of 10% or better was achieved. The same method was then used to determine the ground composition of real samples from van Gogh paintings. The results obtained in this work are part of a more quantitative method of comparing and classifying paint cross sections, which will supplement the more traditional qualitative approach. The information obtained from this study is being used to add to our knowledge of the methods and materials used by van Gogh, which is helping in the reconstruction of van Gogh's oeuvre and attribution.

Keywords

SEMEDXpigmentsground compositionreconstructionsvan Gogh
Type
Analysis of Cultural Heritage Special Section
Information
Microscopy and Microanalysis , Volume 17 , Issue 5 , October 2011 , pp. 686 - 690
Copyright
Copyright © Microscopy Society of America 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Adriaens, A. & Dowsett, M.G. (2004). Electron microscopy and its role in cultural heritage studies. In Non-Destructive Microanalysis of Cultural Heritage Materials, Janssens, K. & Van Grieken, R. (Eds.), pp. 73–128. Amsterdam: Elsevier Science B.V.Google Scholar
Ajò, D., Casellato, U., Fiorin, E. & Vigato, P.A. (2004). Ciro Ferri's frescoes: A study of painting materials and technique by SEM-EDS microscopy, X-ray diffraction, micro FT-IR and photoluminescence spectroscopy. J Cult Heritage 5(4), 333–348.Google Scholar
Aucouturier, M. & Darque-Ceretti, E. (2007). The surface of cultural heritage artefacts: Physicochemical investigations for their knowledge and their conservation. Chem Soc Rev 36, 1605–1621.CrossRefGoogle Scholar
Dredge, P., Wuhrer, R. & Phillips, M.R. (2003). Monet's painting under the microscope. Microsc Microanal 9(2), 139–143.CrossRefGoogle Scholar
Haswell, R., Carlyle, L. & Mensch, K.T.J. (2006). Van Gogh's painting grounds: Quantitative determination of bulking agents (extenders) using SEM/EDX. Microchimica Acta 155, 163–167.CrossRefGoogle Scholar