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A Proposal for a Standard Nomenclature and Interactive Database of Parameters and Correction Algorithms Used in Quantitative Electron Probe Microanalysis

Published online by Cambridge University Press:  21 July 2003

J. T. Armstrong
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-837
J. H. Scott
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-837
J. A. Small
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-837
E. B. Steel
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-837

Abstract

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Abstract
Copyright
Copyright © Microscopy Society of America 2003