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Probing the subtleties of atomic distortions through accurate STEM imaging and density functional theory

Published online by Cambridge University Press:  25 July 2016

James LeBeau ,
Xiahan Sang ,
J. Houston Dycus ,
Changning Nui  and
Douglas Irving
James LeBeau
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NCUSA
Xiahan Sang
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NCUSA
J. Houston Dycus
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NCUSA
Changning Nui
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NCUSA
Douglas Irving
Affiliation:
Department of Materials Science & Engineering, North Carolina State University, Raleigh, NCUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1400 - 1401
Copyright
© Microscopy Society of America 2016 

References

[1] Sang, X & LeBeau, JM Ultramicroscopy 138 (2014) 28–35.CrossRefGoogle Scholar
[2] Sang, X, Oni, AA, ■, A. A. & LeBeau, JM Microscopy and Microanalysis 20 (2014) 1764–1771.CrossRefGoogle Scholar
[3]. Dycus, JH, et al, Microscopy and Microanalysis 21 (2015) 946–952.CrossRefGoogle Scholar
[4] Sang, X, et al, Applied Physics Letters 106 (2015) 061913.CrossRefGoogle Scholar
[5] Sang, X, et al, Applied Physics Letters 106 (2015) 162905.CrossRefGoogle Scholar
[6] Niu, C, et al, Applied Physics Letters 106 (2015) 161906.CrossRefGoogle Scholar
[7] Yankovich, AB, et al, Nature Communications 5 (2014) 1–7.CrossRefGoogle Scholar
[8] The authors acknowledge funding from the Air Force Office of Science Research (FA9550-14-1-0182 and FA9550-12-1-0456) and the National Science Foundation (DMR-1350273).Google Scholar