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Probing the Origin of Microcracks in Layered Oxide Cathodes via Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Xiaoming Liu ,
Xiaowen Zhan ,
Zachary D. Hood  and
Miaofang Chi
Xiaoming Liu*
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
Xiaowen Zhan
Affiliation:
Dept. of Chemical and Materials Engineering, University of Kentucky, Lexington, KYUSA.
Zachary D. Hood
Affiliation:
Dept. of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MAUSA.
Miaofang Chi
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TNUSA.
*
*Corresponding author: liux1@ornl.gov

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2058 - 2059
Copyright
Copyright © Microscopy Society of America 2019 

References

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[6]Research sponsored by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division. Research conducted as part of a user project at ORNL's Center for Nanophase Materials Sciences, a U.S. DOE Office of Science User Facility.Google Scholar