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Probing Properties of Nanomaterials with Advanced Electron Energy-Loss Spectroscopy

Published online by Cambridge University Press:  30 July 2021

Peter Crozier
Affiliation:
Arizona State University, Tempe, Arizona, United States
Joshua Vincent
Affiliation:
Arizona State University, United States
Kartik Venkatraman
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA, United States
Yifan Wang
Affiliation:
School for the Engineering of Matter, Transport and Energy, Arizona State University, United States
Shize Yang
Affiliation:
Arizona State University, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Crozier, P.A. and Miller, B.K., in Controlled Atmosphere Transmission Electron Microscopy Hansen, T.W. and Wagner, J.B., Editors. 2015, Springer: New York.Google Scholar
Venkatraman, K., et al. , Nature Physics, 2019. 15(12): p. 1237-1241.CrossRefGoogle Scholar
Crozier, P.A., Ultramicroscopy, 2017. 180: p. 104-114.CrossRefGoogle Scholar
Krivanek, O.L., et al. , Nature, 2014. 514: p. 209-212.CrossRefGoogle Scholar
Hage, F.S., et al. , Science, 2020. 367(6482): p. 1124-+.Google Scholar
Rez, P. and Singh, A., Ultramicroscopy, 2020: p. 113162.Google Scholar
Venkatraman, K. and Crozier, P.A., Microscopy and Microanalysis (in revision), 2020.Google Scholar
Liu, Q., et al. , Physical Review B, 2019. 99(16): p. 165102.CrossRefGoogle Scholar
Crozier, P.A., Ultramicrosopy, 1995. 58: p. 157-174.CrossRefGoogle Scholar
We gratefully acknowledge support of NSF grants CBET-1604971, CHE-1508667, and U.S. DOE (DE-SC0004954), and the use of (S)TEM at Eyring Materials Center at Arizona State University is gratefully acknowledged.Google Scholar