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Probing Defects in Epitaxially Grown Cubic Boron Nitride on Diamond

Published online by Cambridge University Press:  22 July 2022

Andrew C. Lang ,
David F. Storm ,
Sergey I Maximenko ,
Neeraj Nepal ,
David J Meyer  and
Rhonda M Stroud
Andrew C. Lang*
Affiliation:
Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA
David F. Storm
Affiliation:
Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA
Sergey I Maximenko
Affiliation:
Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA
Neeraj Nepal
Affiliation:
Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA
David J Meyer
Affiliation:
Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA
Rhonda M Stroud
Affiliation:
Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA
*
*Corresponding author: andrew.lang@nrl.navy.mil

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2382 - 2383
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Copyright
Copyright © Microscopy Society of America 2022

References

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