Pre-sharpened and Flat-top Microtip Coupons: a Quantitative Comparison for Atom-Probe Analysis Studies

K Thompson; D J Larson; R M Ulfig

doi:10.1017/S1431927605502629

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Narayan, Kedar Prosa, Ty J. Fu, Jing Kelly, Thomas F. and Subramaniam, Sriram 2012. Chemical mapping of mammalian cells by atom probe tomography. Journal of Structural Biology, Vol. 178, Issue. 2, p. 98.

Heck, Philipp R. Stadermann, Frank J. Isheim, Dieter Auciello, Orlando Daulton, Tyrone L. Davis, Andrew M. Elam, Jeffrey W. Floss, Christine Hiller, Jon Larson, David J. Lewis, Josiah B. Mane, Anil Pellin, Michael J. Savina, Michael R. Seidman, David N. and Stephan, Thomas 2014. Atom‐probe analyses of nanodiamonds from Allende. Meteoritics & Planetary Science, Vol. 49, Issue. 3, p. 453.

Rice, Katherine P. Chen, Yimeng Prosa, Ty J. and Larson, David J. 2016. Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography. Microscopy and Microanalysis, Vol. 22, Issue. 3, p. 583.

Khan, Mansoor Ali Ringer, Simon P. and Zheng, Rongkun 2016. Atom Probe Tomography on Semiconductor Devices. Advanced Materials Interfaces, Vol. 3, Issue. 12,

Douglas, J O Bagot, P A J Johnson, B C Jamieson, D N and Moody, M P 2016. Optimisation of sample preparation and analysis conditions for atom probe tomography characterisation of low concentration surface species. Semiconductor Science and Technology, Vol. 31, Issue. 8, p. 084004.

Diercks, David R. Gorman, Brian P. and Mulders, Johannes J. L. 2017. Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers. Microscopy and Microanalysis, Vol. 23, Issue. 2, p. 321.

Prosa, Ty J. and Larson, David J. 2017. Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, Vol. 23, Issue. 2, p. 194.

Wu, Yizhi Giddings, A. Devin Verheijen, Marcel A. Macco, Bart Prosa, Ty J. Larson, David J. Roozeboom, Fred and Kessels, Wilhelmus M. M. 2018. Dopant Distribution in Atomic Layer Deposited ZnO:Al Films Visualized by Transmission Electron Microscopy and Atom Probe Tomography. Chemistry of Materials, Vol. 30, Issue. 4, p. 1209.

Fleischmann, Claudia Paredis, Kristof Melkonyan, Davit and Vandervorst, Wilfried 2018. Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy. Ultramicroscopy, Vol. 194, Issue. , p. 221.

Frierdich, Andrew J. Saxey, David W. Adineh, Vahid R. Fougerouse, Denis Reddy, Steven M. Rickard, William D. A. Sadek, Abu Z. and Southall, Scarlett C. 2019. Direct Observation of Nanoparticulate Goethite Recrystallization by Atom Probe Analysis of Isotopic Tracers. Environmental Science & Technology, Vol. 53, Issue. 22, p. 13126.

Prosa, Ty J. Strennen, Savanna Olson, David Lawrence, Dan and Larson, David J. 2019. A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability. Microscopy and Microanalysis, Vol. 25, Issue. 2, p. 425.

Op de Beeck, Jonathan Fleischmann, C. Vandervorst, W. and Paredis, K. 2020. Nanoscale Localization of an Atom Probe Tip through Electric Field Mapping. The Journal of Physical Chemistry C, Vol. 124, Issue. 11, p. 6371.

Reddy, Steven M. Saxey, David W. Rickard, William D. A. Fougerouse, Denis Montalvo, Stephanie D. Verberne, Rick and van Riessen, Arie 2020. Atom Probe Tomography: Development and Application to the Geosciences. Geostandards and Geoanalytical Research, Vol. 44, Issue. 1, p. 5.

Qiao, Yi Zhao, Yalong Zhang, Zheng Liu, Binbin Li, Fusheng Tong, Huan Wu, Jintong Zhou, Zhanqi Xu, Zongwei and Zhang, Yue 2021. Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB. Micromachines, Vol. 13, Issue. 1, p. 35.

Gault, Baptiste Chiaramonti, Ann Cojocaru-Mirédin, Oana Stender, Patrick Dubosq, Renelle Freysoldt, Christoph Makineni, Surendra Kumar Li, Tong Moody, Michael and Cairney, Julie M. 2021. Atom probe tomography. Nature Reviews Methods Primers, Vol. 1, Issue. 1,

Dubosq, Renelle Schneider, David A. Zhou, Xuyang Gault, Baptiste Langelier, Brian and Pleše, Pia 2022. Bubbles and atom clusters in rock melts: A chicken and egg problem. Journal of Volcanology and Geothermal Research, Vol. 428, Issue. , p. 107574.

Gault, Baptiste Schweinar, Kevin Zhang, Siyuan Lahn, Leopold Scheu, Christina Kim, Se-Ho and Kasian, Olga 2022. Correlating atom probe tomography with x-ray and electron spectroscopies to understand microstructure–activity relationships in electrocatalysts. MRS Bulletin, Vol. 47, Issue. 7, p. 718.

Cuduvally, Ramya Morris, Richard J. H. Oosterbos, Giel Ferrari, Piero Fleischmann, Claudia Forbes, Richard G. and Vandervorst, Wilfried 2022. Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study. Journal of Applied Physics, Vol. 132, Issue. 7,

Op de Beeck, Jonathan Scheerder, Jeroen E Geiser, Brian P Bunton, Joseph H Ulfig, Robert M Larson, David J van der Heide, Paul Vandervorst, Wilfried and Fleischmann, Claudia 2022. The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes. Microscopy and Microanalysis, Vol. 28, Issue. 4, p. 1141.

Persaud, Suraj. Y. Binns, Wilfred J. Guo, Mengnan Williams, Desmond Dong, Qingshan Arcuri, Gabriel A. Daub, Kevin Newman, Roger C. Daymond, Mark R. and Keech, Peter G. 2023. Applying state‐of‐the‐art microscopy techniques to understand the degradation of copper for nuclear waste canisters. Materials and Corrosion, Vol. 74, Issue. 11-12, p. 1619.

Article contents

Pre-sharpened and Flat-top Microtip Coupons: a Quantitative Comparison for Atom-Probe Analysis Studies

Extract

Save article to Kindle

Save article to Dropbox

Save article to Google Drive

Reply to: Submit a response

Your details

You have entered the maximum number of contributors

Conflicting interests