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Microscopy and Microanalysis Microscopy and Microanalysis

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Phase-Change Materials; the Challenges for TEM

Published online by Cambridge University Press:  01 August 2018

Shalini Tripathi ,
Matthew Janish ,
Faruk Dirisaglik ,
Adam Cywar ,
Yu Zhu ,
Katie Jungjohann ,
Helena Silva  and
C. Barry Carter
Shalini Tripathi
Affiliation:
Electrical & Computer Engineering, University of Connecticut, Storrs, CT.
Matthew Janish
Affiliation:
Materials Science & Engineering, University of Connecticut, Storrs, CT.
Faruk Dirisaglik
Affiliation:
Electrical & Computer Engineering, University of Connecticut, Storrs, CT.
Adam Cywar
Affiliation:
Electrical & Computer Engineering, University of Connecticut, Storrs, CT.
Yu Zhu
Affiliation:
IBM Thomas J Watson Research Center, 1101 Kitchawan Road, Yorktown Heights, NY.
Katie Jungjohann
Affiliation:
Center for Integrated Nanotechnologies (CINT), Sandia National Lab, Albuquerque, NM.
Helena Silva
Affiliation:
Electrical & Computer Engineering, University of Connecticut, Storrs, CT.
C. Barry Carter
Affiliation:
Materials Science & Engineering, University of Connecticut, Storrs, CT. Chemical & Biomolecular Engineering, University of Connecticut, Storrs, CT.
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Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1904 - 1905
Copyright
© Microscopy Society of America 2018 

References

[1] Fong, S, Neumann, C Wong, H IEEE Trans Electron Devices 64 2017) p. 4374.CrossRefGoogle Scholar
[2] Lencer, D, Salinga, M Wuttig, M Advanced Materials 23 2011) p. 2030.CrossRefGoogle Scholar
[3] ST, HS and CBC acknowledge the funding support by the National Science Foundation under award DMR-1710468. The TEM analysis was performed at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science by Los Alamos National Laboratory (Contract DE-AC52-06NA25396) and Sandia National Laboratories (Contract DE-NA-0003525).Google Scholar
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