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The Performance of Electron Counting Direct Detection in Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  05 August 2019

Shaobo Cheng ,
Paolo Longo ,
Ray D. Twesten  and
Gianluigi A. Botton
Shaobo Cheng
Affiliation:
Canadian Centre for Electron Microscopy and Department of Materials Science and Engineering, McMaster University, Hamilton, Canada.
Paolo Longo
Affiliation:
Gatan Inc., Pleasanton, CA, USA.
Ray D. Twesten
Affiliation:
Gatan Inc., Pleasanton, CA, USA.
Gianluigi A. Botton*
Affiliation:
Canadian Centre for Electron Microscopy and Department of Materials Science and Engineering, McMaster University, Hamilton, Canada.
*
*Corresponding author: gbotton@mcmaster.ca

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 586 - 587
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Cheng, S., et al. , Science Advances 4 (2018) eaar4298.Google Scholar
[2]Li, X., et al. , Advanced Materials Interfaces 6 (2018), p. 1701246.Google Scholar
[3]Li, X., et al. , Nature Methods 10 (2013), p. 584.Google Scholar
[4]Zhu, Y., et al. , Nature Materials 16 (2017), p. 532.Google Scholar
[5]Hart, J. L., et al. , Scientific Reports 7 (2017), p. 8243.Google Scholar
[6]G. A. B and S. C. are grateful to NSERC for a Discovery Grant partially supporting this work. G. A. B is grateful to the Canada Foundation for Innovation, under the JELF program, for supporting the acquisition of the K2 IS detector. Electron microscopy was carried out at the Canadian Centre for Electron Microscopy (CCEM), a national facility supported by NSERC, the Canada Foundation for Innovation, under the MSI program, and McMaster University.Google Scholar