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Overcoming Traditional Challenges in Nano-scale X-ray Characterization Using Independent Component Analysis

Published online by Cambridge University Press:  23 September 2015

David Rossouw
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, UK
Pierre Burdet
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, UK
Francisco de la Pena
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, UK
Caterina Ducati
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, UK
Benjamin R. Knappett
Affiliation:
Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge, CB2 1EW, UK
Andrew E. H. Wheatley
Affiliation:
Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge, CB2 1EW, UK
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, UK

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Lucas, G., Burdet, P., Cantoni, M. & Hebert, C., Micron 52 (2013). p. 49.Google Scholar
[2] Jutten, C. & Herault, J., Signal Processing 24 (1991). p. 1.Google Scholar
[4] D.R. acknowledges support from the Royal Society's Newton International Fellowship scheme. B.R.K. thanks the UK EPSRC for financial support (EP/J500380/1). F.d.l.P. and C.D. acknowledge funding from the ERC under grant no. 259619 PHOTO EM. P.A.M and P.B. acknowledges financial support from the European Research Council under the European Union’s Seventh Framework Programme (FP7/2007-2013) / ERC grant agreement 291522-3DIMAGE. P.A.M. also acknowledges financial support from the European Union’s Seventh Framework Programme of the European Commission: ESTEEM2, contract number 312483.Google Scholar