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Optimization of Acquisition Parameters for Atomic-Column Electron Energy-Loss Spectrum Imaging in a JEM-2200FS Aberration-Corrected Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  03 August 2008

M Watanabe ,
M Kanno ,
D Ackland ,
CJ Kiely  and
DB Williams
M Watanabe
Affiliation:
Lawrence Berkeley National Laboratory
M Kanno
Affiliation:
JEOL Ltd, Japan
D Ackland
Affiliation:
Lehigh University
CJ Kiely
Affiliation:
Lehigh University
DB Williams
Affiliation:
Lehigh University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1400 - 1401
Copyright
© 2008 Microscopy Society of America

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