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Noise Reconstruction and Removal Network: a New Way to Denoise FIB-SEM Image

Published online by Cambridge University Press:  22 July 2022

Katya Giannios
Affiliation:
Micron Technology, Inc, Advanced Computing and Emerging Memory Solutions, Boise, ID, United States
Abhishek Chaurasia
Affiliation:
Micron Technology, Inc, Advanced Computing and Emerging Memory Solutions, Boise, ID, United States
Guillaume Thibault*
Affiliation:
Dept. of Biomedical Engineering, Oregon Health & Science University, Portland, OR, United States Knight Cancer Institute, Oregon Health & Science University, Portland, OR, United States
Jessica L. Riesterer
Affiliation:
Dept. of Biomedical Engineering, Oregon Health & Science University, Portland, OR, United States Multiscale Microscopy Core, Oregon Health & Science University, Portland, OR, United States Knight Cancer Institute, Oregon Health & Science University, Portland, OR, United States
Erin S. Stempinski
Affiliation:
Dept. of Biomedical Engineering, Oregon Health & Science University, Portland, OR, United States Multiscale Microscopy Core, Oregon Health & Science University, Portland, OR, United States
Terence P. Lo
Affiliation:
Knight Cancer Institute, Oregon Health & Science University, Portland, OR, United States
Bambi DeLaRosa*
Affiliation:
Micron Technology, Inc, Advanced Computing and Emerging Memory Solutions, Boise, ID, United States
Joe W. Gray
Affiliation:
Dept. of Biomedical Engineering, Oregon Health & Science University, Portland, OR, United States Knight Cancer Institute, Oregon Health & Science University, Portland, OR, United States
*
*Corresponding author: thibaulg@ohsu.edu, bdelarosa@micron.com
*Corresponding author: thibaulg@ohsu.edu, bdelarosa@micron.com

Abstract

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Type
3D Volume Electron Microscopy in Biology Research
Copyright
Copyright © Microscopy Society of America 2022

References

Xu, CS et al. , Elife 6 (2017), p. e25916.Google Scholar
Redmon, J and Farhadi, A, arXiv preprint (2018), arXiv:1804.02767.Google Scholar
Tan, M, Pang, R and Le, QV, Proceedings of the IEEE/CVF conference on computer vision and pattern recognition (2020).Google Scholar
Sun, W and Chen, Z, IEEE Transactions on Image Processing, 29 (2020), p. 4027.CrossRefGoogle Scholar
Chen, L-C et al. , Advances in neural information processing systems (2017).Google Scholar
Ronneberger, O, Fischer, P and Brox, T, arXiv e-prints (2015), arXiv:1505.04597.Google Scholar
Tao, A, Sapra, K and Catanzaro, B, arXiv preprint (2020), arXiv:2005.10821.Google Scholar
Kim, D-W, Chung, JR and Jung, S-W, Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (2019).Google Scholar
Liu, J et al. , Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (2019).Google Scholar
Yu, S, Park, B and Jeong, J, in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops (2019).Google Scholar
Shi, X, et al. , arXiv e-prints (2015), arXiv:1506.04214.Google Scholar
Cho, K, et al. , arXiv preprint (2014), arXiv:1406.1078.Google Scholar
Wu, D, et al. , arXiv e-prints (2019), arXiv:1906.03639.Google Scholar
Remez, T., et al. , arXiv e-prints (2017), arXiv:1701.01698.Google Scholar
Remez, T. et al. , IEEE Transactions on Image Processing 27 (2018), p. 5707.CrossRefGoogle Scholar