Hostname: page-component-788cddb947-w95db Total loading time: 0 Render date: 2024-10-15T09:16:13.124Z Has data issue: false hasContentIssue false
  • English
  • Français

Next-generation X-ray Optics for High Resolution Applications

Published online by Cambridge University Press:  10 August 2018

Wenbing Yun ,
Mark Cordier ,
Benjamin Stripe ,
Sylvia Lewis  and
Janos Kirz
Wenbing Yun*
Affiliation:
Sigray | Concord, CA
Mark Cordier
Affiliation:
Sigray | Concord, CA
Benjamin Stripe
Affiliation:
Sigray | Concord, CA
Sylvia Lewis
Affiliation:
Sigray | Concord, CA
Janos Kirz
Affiliation:
Sigray | Concord, CA
*
*wyun@sigray.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 300 - 301
Copyright
© Microscopy Society of America 2018