Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-26T21:29:31.422Z Has data issue: false hasContentIssue false
  • English
  • Français

A Newly Developed Fib System For Tem Specimen Preparation

Published online by Cambridge University Press:  01 November 2002

T. Kamino ,
T. Yaguchi ,
Y. Kuroda ,
T. Hashimoto ,
T. Ohnishi ,
T. Ishitani ,
K. Umemura  and
K. Asayama
T. Kamino
Affiliation:
Hitachi Science Systems, Ltd., 882 Ichige, Hitachinaka, Ibaraki, 312-8504 Japan
T. Yaguchi
Affiliation:
Hitachi Science Systems, Ltd., 882 Ichige, Hitachinaka, Ibaraki, 312-8504 Japan
Y. Kuroda
Affiliation:
Hitachi Science Systems, Ltd., 882 Ichige, Hitachinaka, Ibaraki, 312-8504 Japan
T. Hashimoto
Affiliation:
Hitachi High-Technologies Corp., 882 Ichige, Hitachinaka, Ibaraki, 312-8504 Japan
T. Ohnishi
Affiliation:
Hitachi High-Technologies Corp., 882 Ichige, Hitachinaka, Ibaraki, 312-8504 Japan
T. Ishitani
Affiliation:
Hitachi High-Technologies Corp., 882 Ichige, Hitachinaka, Ibaraki, 312-8504 Japan
K. Umemura
Affiliation:
Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185-8601 Japan
K. Asayama
Affiliation:
Semiconductor and Integrated Circuits Division, Hitachi, Ltd., Oume, Tokyo, 198-8512 Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 48 - 49
Copyright
Copyright © Microscopy Society of America 2002