Hostname: page-component-77c89778f8-vpsfw Total loading time: 0 Render date: 2024-07-18T09:56:57.607Z Has data issue: false hasContentIssue false
  • English
  • Français

New Views of Materials through Aberration-Corrected STEM

Published online by Cambridge University Press:  05 August 2007

S Pennycook ,
AR Lupini ,
K van Benthem ,
M Varela ,
M Chisholm ,
AY Borisevich ,
C Contescu ,
NC Gallego ,
T Pennycook  and
Y Peng
...Show all authors
S Pennycook
Affiliation:
Oak Ridge National Laboratory
AR Lupini
Affiliation:
Oak Ridge National Laboratory
K van Benthem
Affiliation:
Oak Ridge National Laboratory
M Varela
Affiliation:
Oak Ridge National Laboratory
M Chisholm
Affiliation:
Oak Ridge National Laboratory
AY Borisevich
Affiliation:
Oak Ridge National Laboratory
C Contescu
Affiliation:
Oak Ridge National Laboratory
NC Gallego
Affiliation:
Oak Ridge National Laboratory
T Pennycook
Affiliation:
Oak Ridge National Laboratory
Y Peng
Affiliation:
Oak Ridge National Laboratory
M Oxley
Affiliation:
Oak Ridge National Laboratory
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1168 - 1169
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)