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A New Method for Defocus and Astigmatism Correction in Electron Microscopy

Published online by Cambridge University Press:  08 April 2017

M Rudnaya ,
W Van den Broek ,
R Doornbos ,
S Kho ,
R Mattheij  and
J Maubach
M Rudnaya
Affiliation:
Eindhoven University of Technology
W Van den Broek
Affiliation:
University of Antwerp
R Doornbos
Affiliation:
Embedded Systems Institute
S Kho
Affiliation:
Eindhoven University of Technology
R Mattheij
Affiliation:
Eindhoven University of Technology
J Maubach
Affiliation:
Eindhoven University of Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 528 - 529
Copyright
Copyright © Microscopy Society of America 2011