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A New Method for Characterizing 3D Microstructures Using Lab-based Diffraction Contrast Tomography

Published online by Cambridge University Press:  01 August 2018

Hrishikesh Bale
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA.
Will Harris
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA.
Steve Kelly
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA.
Nicolas Gueninchault
Affiliation:
Xnovo Technology ApS, K0ge, Denmark
Jun Sun
Affiliation:
Xnovo Technology ApS, K0ge, Denmark
Erik Lauridsen
Affiliation:
Xnovo Technology ApS, K0ge, Denmark
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Abstract

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Copyright
© Microscopy Society of America 2018 

References

[1] Lienert, U., et al., Journal of the Minerals, Metals & Materials Society 63 2011) p. 70.CrossRefGoogle Scholar
[2] Juul Jensen, D. Poulsen, H.F. Materials Characterization 72 2012) p. 1.CrossRefGoogle Scholar
[3] Keinan, R., et al., Acta Materialia (In Press 2018.Google Scholar
[4] McDonald, S. A., et al., Scientific Reports 7 2017) p. 5251.CrossRefGoogle Scholar
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