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A New High-Resolution Electron Microscope with Easy Operation System for Nano Analysis

Published online by Cambridge University Press:  01 November 2002

M. Matsushita ,
M. Ohsaki ,
Y. Kondo ,
M. Naruse ,
T. Honda  and
M. Kersker
M. Matsushita
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
M. Ohsaki
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
Y. Kondo
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
M. Naruse
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
T. Honda
Affiliation:
JEOL Ltd., Musashino 3-1-2, Akishima, Tokyo 196-8558, Japan
M. Kersker
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA 01960, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1106 - 1107
Copyright
Copyright © Microscopy Society of America 2002