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New Developments in Automated Particle Analysis in the Electron Microscope - from Micro to Nano

Published online by Cambridge University Press:  23 September 2015

Christian Lang
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe UK
Matthew Hiscock
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe UK
James Holland
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe UK
Susumu Yamaguchi
Affiliation:
Oxford Instruments KK, Tokyo, Japan
David Joyce
Affiliation:
Mantis Deposition Ltd., Thame, UK
Georgia Vatougia
Affiliation:
Mantis Deposition Ltd., Thame, UK

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015