A New Detection Metric for EDS Detectors

Patrick P. Camus

doi:10.1017/S1431927617005980

A New Detection Metric for EDS Detectors

Published online by Cambridge University Press: 04 August 2017

Patrick P. Camus

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Patrick P. Camus*: Affiliation:
EDAX Inc, 91 McKee Place, Mahwah, NJ, USA.

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Abstract

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1064 - 1065

DOI: https://doi.org/10.1017/S1431927617005980 [Opens in a new window]

References

[1] http://tpm.amc.anl.gov/NJZTools/XEDSSolidAngle.html.Google Scholar

[2] http://henke.lbl.gov/optical_constants/filter2.html.Google Scholar

Article contents

A New Detection Metric for EDS Detectors

Abstract

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