Hostname: page-component-76fb5796d-qxdb6 Total loading time: 0 Render date: 2024-04-25T12:58:02.319Z Has data issue: false hasContentIssue false
  • English
  • Français

Native Passive Film on Stainless Steel -Direct Imaging and Analysis using Aberration Corrected STEM-

Published online by Cambridge University Press:  23 November 2012

E. Hamada ,
K. Yamada ,
K. Sato ,
T. Ishii  and
T. Ujiro
E. Hamada
Affiliation:
JFE Steel Corporation, Kawasaki, Kanagawa, Japan
K. Yamada
Affiliation:
JFE Steel Corporation, Kawasaki, Kanagawa, Japan
K. Sato
Affiliation:
JFE Steel Corporation, Kawasaki, Kanagawa, Japan
T. Ishii
Affiliation:
JFE Steel Corporation, Kawasaki, Kanagawa, Japan
T. Ujiro
Affiliation:
JFE Techno Research Corporation, Chiba, Japan
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1916 - 1917
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)