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Nanoscale Imaging of Structural and Optical Properties Using Helium Temperature Scanning Transmission Electron Microscopy Cathodoluminescence of Nitride Based Nanostructures

Published online by Cambridge University Press:  25 July 2016

Frank Bertram ,
Marcus Müller ,
Gordon Schmidt ,
Peter Veit ,
Silke Petzold ,
Steven Albert ,
Ana María Bengoechea-Encabo ,
Miguel Ángel Sánchez-Garcia ,
Enrique Calleja  and
Jürgen Christen
Frank Bertram
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Marcus Müller
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Gordon Schmidt
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Peter Veit
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Silke Petzold
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany
Steven Albert
Affiliation:
ISOM and Departamento de Ingenieria Electronica, Universidad Politecnica de Madrid, Spain
Ana María Bengoechea-Encabo
Affiliation:
ISOM and Departamento de Ingenieria Electronica, Universidad Politecnica de Madrid, Spain
Miguel Ángel Sánchez-Garcia
Affiliation:
ISOM and Departamento de Ingenieria Electronica, Universidad Politecnica de Madrid, Spain
Enrique Calleja
Affiliation:
ISOM and Departamento de Ingenieria Electronica, Universidad Politecnica de Madrid, Spain
Jürgen Christen
Affiliation:
Institute of Experimental Physics, Otto-von-Guericke-University Magdeburg, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 600 - 601
Copyright
© Microscopy Society of America 2016