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Model for predicting surface properties of lasered samples

Published online by Cambridge University Press:  30 July 2021

Adrian Phoulady
Affiliation:
REFINE Center, University of Connecticut, United States
Hongbin Choi
Affiliation:
University of Connecticut, Storrs, Connecticut, United States
Nicholas May
Affiliation:
University of Connecticut, Connecticut, United States
Bahar Ahmadi
Affiliation:
University of Connecticut, United States
Pouya Tavousi
Affiliation:
UConn Tech Park, University of Connecticut, storrs, Connecticut, United States
Sina Shahbazmohamadi
Affiliation:
University of Connecticut, Storrs, Connecticut, United States

Abstract

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Type
Microscopy and Microanalysis for Real World Problem Solving
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Konnik, Matthew, et al. “Training AI-Based Feature Extraction Algorithms, for Micro CT Images, Using Synthesized Data.” Journal of Nondestructive Evaluation 40.1 (2021): 1-13.Google Scholar
May, Nicholas, et al. “Correlative microscopy workflow for precise targeted failure analysis of multi-layer ceramic capacitors.” Microelectronics Reliability 114 (2020): 113858.CrossRefGoogle Scholar