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Microstructural Investigation of Resistive Switching Behavior in Titanium Oxide using in-situ TEM

Published online by Cambridge University Press:  23 November 2012

D. Ko ,
S. Kim ,
T. Ahn ,
S. Kim ,
Y. Oh  and
Y. Kim
D. Ko
Affiliation:
Seoul National University, Seoul, Republic of Korea
S. Kim
Affiliation:
Seoul National University, Seoul, Republic of Korea
T. Ahn
Affiliation:
Seoul National University, Seoul, Republic of Korea
S. Kim
Affiliation:
Seoul National University, Seoul, Republic of Korea
Y. Oh
Affiliation:
Seoul National University, Seoul, Republic of Korea
Y. Kim
Affiliation:
Seoul National University, Seoul, Republic of Korea
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1906 - 1907
Copyright
Copyright © Microscopy Society of America 2012

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